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Available Technologies and Updates to Improve Global Supply Chain Integration and Total Asset Visibility

Mr Joseph Zagursky,
US Army, United States
 
 
This presentation was given at RFID Smart Labels USA 2008 on 2008年02月20日.
 

プレゼンテーション概要

  • Utilizing PM J-AIT to leverage technologies in order to meet current and emerging DoD requirements
  • Hear what AIT solutions are available and how they can improve your current business processes

講演者の経歴 (Joseph Zagursky)

Mr. Joseph Zagursky is a Project Engineer for the Product Manager Joint-Automatic Identification Technology (PM J-AIT) under the US Army's Program Executive Office Enterprise Information Systems (PEO EIS). Mr. Zagursky has been involved with numerous programs over the years for the Department of Defense (DoD), including Logistics Applications of Automated Marking and Reading Symbols (LOGMARS) and Microcircuit Technology in Logistics Applications (MITLA), which were the precursors for Automatic Identification Technology (AIT) and Radio Frequency Identification (RFID). His current initiatives include infusing passive RFID technology into the DoD mainstream and migrating DoD active RFID technology towards the recently ratified ISO 18000-7 Standard. Mr. Zagursky earned his Bachelor of Science degree in Engineering from Penn State University and holds his Professional Engineer (P.E.) license.