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Practical RFID technology solution in manufacture for quality control

Dr Ryo Imura, Chief Executive Managing Director

Hitachi Ltd, Mu Solutions Division, Japan

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Hitachi presentation - reload 9 Jul (fix error on Page 24)^*

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Mr Chris Hook, Wireless Technologies Leader Deloitte Consulting, United States at Smart Labels USA 2005

Mr Chang-Gyoo Kim, Manager, RFID Technical Sales Team Samsung Techwin co., ltd., Korea at Smart Labels USA 2005

Mr Todd Humes, CTO Impinj, United States at Smart Labels USA 2005

Mr Joe White, Vice President, PICA Engineering Symbol, United States at Smart Labels USA 2005

Mr Donny V Lee, President & CEO AWID, United States at Smart Labels USA 2005

Mr Bill Davidson, CTO and Executive VP Samsys, Canada at Smart Labels USA 2005