RFID Process Control System for Yield Improvement and Prevention of Defects
![]() Dr Robert P Bishop, President
Beltronics, United States
|
|
This presentation was
given at RFID Smart Labels USA 2008 on 2008年02月21日.
ダウンロードプレゼンテーション概要講演者の経歴 (Robert P Bishop)Dr. Robert Bishop founded Beltronics in 1980. The company specializes in production line inspection systems for organic electronics, MEM's, and advanced packaging applications. Dr. Bishop holds numerous patents for inspection of organic electronics. He received joint doctorate degrees in electrical engineering and computer science with emphasis on neural network systems from MIT and Harvard, Cambridge, Massachusetts, USA in 1980. 会社紹介 (Beltronics)Beltronics manufactures high volume production line process control and yield improvement systems for the semiconductor and electronics industry. The company is based in Needham, Massachusetts, USA. Products include automated inline systems for high resolution inspection and process monitoring of organic electronics with significant process variations in topology, color, and texture. The company has pioneered numerous products for inspection of organic electronics and has an extensive international patent portfolio of inspection technologies developed over the past 27 years. |


