RFID system design using 3D EM simulation tools

Marc Ruetschlin,

CST UK, United Kingdom

This presentation was given at RFID Europe 2008 on Oct 01, 2008.

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Presentation Summary

full model parameterisation to analyse the effects of construction tolerances and geometric variations in conformal tags
hybrid electromagnetic and circuit simulation for full system analysis
optimisation of tag geometry and sensor placement to fulfil design goals

Speaker Biography (Marc Ruetschlin)

Marc Rütschlin grew up and studied in Stellenbosch, South Africa. After completing his PhD in Electronic Engineering, he did post-doctoral studies at NIST in Boulder, Colorado, and at the University of Karlsruhe in Germany, with a focus on small antenna design and electromagnetic wave propagation. Marc joined CST in January 2007, and currently works as an application engineer from CST's UK office in Nottingham.

Events

15 - 16 May 2012

Reports

Presentations

Mr Kari-Matti Varanki, Nicanti Oy, Finland at RFID Europe 2008

Dr. Tilak Dias, EntellFibres, United Kingdom at RFID Europe 2008

Dr Humberto J Moran, Director Friendly Technologies, United Kingdom at RFID Europe 2008

Mr Vivek Khandelwal, Director of Marketing Verayo, Inc., United States at RFID Europe 2008

Joerg Schmidt, Manger Infineon Technologies AG, Germany at RFID Europe 2008

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