Photo-Excited Charge Collection Spectroscopy (PECCS) as a Measurement Probe for the Electrical Stability of Solution Organic/Oxide TFTs (Printed Electronics USA 2012)


Prof Seongil Im,
Yonsei University
Korea
 
Dec 06, 2012.

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Presentation Summary

  • Outline of PECCS measurements: What is PECCS?, Why is it useful?
  • What's the mechanism of PECCS?: It uses transistor transfer curves combined with a photon illumination which probes or excites the deep-trapped charges located at the dielectric/channel interface.
  • Examples of PECCS measurements on the cases of organic TFTs and oxide TFTs: Trap density-of-states (DOS) analysis and peak assignments
  • Two PECCS method: ID-VG method and Capacitance-Voltage method

Speaker Biography (Seongil Im)

Seongil Im achieved his Ph.D from Univ. of California at Berkeley at the dept. of MSE in 1994 and worked as a research fellow at the dept. of Applied Physics and Electrical Engineering in CALTECH from 1995 till 1996. He joined the dept. of MSE at Yonsei Univ. as an assistant professor in 1997. But, currently he is a professor at Phys. Dept. His research expertise is device physics on Oxide and Organic Thin-Film Electronics, Nanowire and nanosheet FETs, and Photon-probe device characterizations for stabilities. He has published ~200 peer-review journal papers including Applied Physics Letters, Advanced Materials, Nano Letters, and IEEE Electron Device Letters, etc.

Company Profile (Yonsei University)

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Yonsei University is located in Seoul, Korea, as the first university built in Korea in 1915 by a founder, Dr. H. Underwood. It is known to be second largest university in Korea, having more than 1500 PhD faculties including MDs in Severance University Hospital. About 20,000 undergraduate and 2,000 grad students are around the campus.
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