RFID system design using 3D EM simulation tools

Marc Ruetschlin,
CST UK, United Kingdom
 
Oct 01, 2008.

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Presentation Summary

  • full model parameterisation to analyse the effects of construction tolerances and geometric variations in conformal tags
  • hybrid electromagnetic and circuit simulation for full system analysis
  • optimisation of tag geometry and sensor placement to fulfil design goals

Speaker Biography (Marc Ruetschlin)

Marc Rütschlin grew up and studied in Stellenbosch, South Africa. After completing his PhD in Electronic Engineering, he did post-doctoral studies at NIST in Boulder, Colorado, and at the University of Karlsruhe in Germany, with a focus on small antenna design and electromagnetic wave propagation. Marc joined CST in January 2007, and currently works as an application engineer from CST's UK office in Nottingham.