The presentation describes how a high-volume production of printed electronics and thin-film systems in general can be monitored during deposition and drying. Especially the drying process has to be fully completed in order to ensure device performance. The variety of printed structures and the trend of printing devices with higher printing density require advanced testing and process control strategies in order to avoid over and under drying and respectively to manufacture a reliable printed device.

Dipl.-Wi.-Ing. Marcus Klein is managing director of the SURAGUS GmbH. He got his master degree in Business and Engineering from University of Technology Dresden focusing on microelectronics and electronic packaging. Past working experiences include Siemens Pte Singapore, Wacker Chemie, Advanced Mask Technology Center and Fraunhofer Institute for non-destructive testing Dresden. He is managing director of SURAGUS since 2010.

SURAGUS GmbH offers non-contact testing solutions for the thin film characterization (sheet resistance measurement & defect analysis) of TCO, nanowires, graphens, Cu, Al, Zn, for the structural analysis and grammature of carbon fiber materials (non-woven, carbon fiber fabrics, prepreg, CFRP) and for the material characterization of metal and alloy.