Conference Downloads
Presentations and audio are available only where permission has been given by the speaker.
For those of you who have purchased the audio proceedings these too are available for download.
If you have any problems please contact Laura Roberts at l.roberts@idtechex.com
Tuesday, 13 Apr 2010| | Keynote Speakers |
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| 08:45 | Nokia | | 09:35 | Procter & Gamble | | 10:25 | Refreshment Break | | 11:55 | Sharp Laboratories of America | | 12:20 | Stora Enso Packaging Boards | | 11:05 | Plastic Logic GmbH | | 08:30 | IDTechEx | | 10:00 | DARPA MTO | | 12:20 | Ericsson | | 09:10 | TOTAL S.A. - Gas & Power | | 11:30 | ST Ericsson | | 12:45 | LUNCH |
Track 1| | End Users |
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| 14:40 | Electrolux Italia S.p.A | | 15:05 | Kimberly-Clark | | 14:15 | Novalia |
| | Transit |
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| 15:55 | Break | | 16:35 | RATP (Paris Transport) | | 15:30 | Cubic Transportation Systems |
| Track 2| | The E-reader Surge |
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| 14:40 | E Ink Corporation | | 15:05 | Bridgestone Corporation | | 14:15 | iRex Technologies BV |
| | Printed RFID |
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| 15:55 | Refreshment Break | | 16:35 | Sunchon National University | | 15:30 | Seoul National University |
| | Smart Textiles |
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| 17:50 | TNO Holst Center | | 17:25 | National Physical Laboratory | | 17:00 | Ohmatex ApS |
| Track 3| | Inorganic Technologies |
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| 17:25 | Sandia National Laboratories | | 17:50 | Solarion AG | | 16:35 | EMPA | | 17:00 | Q-mo solar AG | | 18:15 | Day 1 Track 3 Ends |
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Wednesday, 14 Apr 2010Track 1 | Track 2| | CNT & Graphene |
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| 09:20 | Fujitsu Laboratories Ltd | | 09:45 | Canatu Oy | | 10:10 | Refreshment Break |
| | Replacing ITO |
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| 15:15 | Agfa Materials | | 15:40 | Fraunhofer ISC | | 16:05 | Refreshment Break | | 16:45 | Day 2 Track 2 Ends |
| Track 3| | Organic and DSSC Photovoltaics |
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| 10:10 | Refreshment Break | | 10:50 | TU Dresden | | 08:55 | IDTechEx | | 11:40 | Coatema Coating Machinery GmbH | | 09:20 | CSIRO | | 09:45 | Dyesol | | 08:30 | Konkuk University | | 11:15 | Universitat Jaume I |
| | Barrier Materials |
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| 12:05 | 3M Display & Graphics Business Lab | | 12:30 | LUNCH | | 14:25 | DELO Industrial Adhesives | | 14:00 | TNO Holst Center | | Huntsman Advanced Materials Switzerland |
| | Sensors |
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| 15:15 | VTT Technical Research Centre of Finland |
| Track 4| | Memory & Transistors |
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| 09:20 | Toppan Printing Co Ltd | | 09:45 | Nano ePrint Ltd | | 08:55 | HUECK FOLIEN Ges.m.b.H. | | 08:30 | NIST | | 10:10 | Refreshment Break |
| | Printing |
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| 11:15 | Xennia Technology Ltd | | 12:30 | LUNCH | | 15:15 | Technische Universität Darmstadt | | 12:05 | Optomec Inc | | 14:00 | Daetwyler R&D Corp | | 14:50 | Fundacio Privada Cetemmsa | | 10:50 | Flexible Display Roll to Roll Research Center(FDRC) | | 14:25 | Korea Institute of Machinery and Materials | | 11:40 | PixDro b.v. | | 15:40 | MatOx Limited | | 16:05 | Refreshment Break | | 16:45 | Day 2 Track 4 Ends |
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Wednesday April 14, 2010
The Rise of Zinc Oxide Electronics (10:50 - 12:05)
10:50 - 11:15 "Advances in Zinc Oxide-Based Transparent TFTs Produced at Low Temperature."- A brief introduction to High Target Utilization Sputtering (HiTUS) and its advantages over competing technologies.
- The structure of the TFT devices produced by HiTUS will be presented and will detail the reproducibility of the devices together with a discussion of how the fabrication process varies the TFT parameters.
- The performance of devices such as inverters and ring oscillators will also be demonstrated.
11:15 - 11:40 "Patterned Deposition of Transparent and Conductive Layers - New Pathways Towards Cost Efficient Manufacturing Techniques"- Sol-gel processing of TCO thin films
- Pad-printing of 2-D structured ITO films
- Implementation of printed ITO films into OLED production
11:40 - 12:05 "Roll-to-Roll Fabrication of Large Area Electronics: Imprinting, Testing, Defect Detection"The transition from wafer-based photolithographic batch processing to roll-to-roll, imprint based processing requires new approaches in a number of areas
- Imprint lithography requires control of a number of key parameters to insure uniformity and high imprint quality
- Testing on roll-to-roll dimensionally unstable substrates requires new approaches to probing and electrical testing
- Defect detection is must handle the flexibility of the substrate and the novel nature of roll-to-roll imprint defects