Surface metrology for printed electronics (Printed Electronics Europe 2006)

Mr Freek Pasop, Product Manager - Optical
Veeco Instruments SAS, France
 

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Veeco provides solutions for nanoscale applications in the worldwide scientific research, semiconductor, data storage, and high- brightness-LED/ wireless markets. Our Metrology products are used to measure at the micro- and nanoscale, and include atomic force microscopes, scanning probe microscopes, and stylus and optical profilers.Our Process Equipment tools help create nanoscale devices and include ion beam etch and deposition, physical vapor deposition, molecular beam epitaxy, metal organic chemical vapor deposition, precision lapping and dicing technologies.
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