Surface metrology for printed electronics (Printed Electronics Europe 2006)

Mr Freek Pasop, Product Manager - Optical
Veeco Instruments SAS, France
 

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Presentation Summary

  • Principles of Stylus Profilometry, Optical Interferometry and Atomic Force Microscopy
  • Pro's and con's of these techniques for printed electronics applications will be explained
  • Applications of optical, non contact 3D measurements will be highlighted

Speaker Biography

Freek Pasop has a BSc degree in Chemical Engineering. He is since 10 years active in the field of Surface Metrology, since 4 years working for Veeco Instruments. His current role is product manager for the Optical Profilers of Veeco in Europe.

Company Profile

Veeco provides solutions for nanoscale applications in the worldwide scientific research, semiconductor, data storage, and high- brightness-LED/ wireless markets.
Our Metrology products are used to measure at the micro- and nanoscale, and include atomic force microscopes, scanning probe microscopes, and stylus and optical profilers.Our Process Equipment tools help create nanoscale devices and include ion beam etch and deposition, physical vapor deposition, molecular beam epitaxy, metal organic chemical vapor deposition, precision lapping and dicing technologies.