Challenges in Advancing Printed Electronic Detection Sensors (Printed Electronics & Photovoltaics Europe 2010)

Mr Walt Bonneau, President
Cubic Transportation Systems, United States
United States
 
Apr 13, 2010.

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Presentation Summary

  • Latest markets requiring printed electronic detection sensors
  • Applying the right technology to develop durable and cost-effective detection sensors
  • Achieving high quality and high volume production of sensors while overcoming production challenges

Speaker Biography (Walt Bonneau)

Walt Bonneau Jr. is an Executive Sr. Vice president/chief technologist and general manager of Transportation and Security Systems for Cubic Corporation, a world's leading supplier of smart card ticketing, revenue management and security systems for public transportation and military training systems. He is responsible for guiding the company's engineering, technical and scientific vision and overall strategy, as well as the technical performance of the company's security systems activities. Under his leadership, Cubic has attained multiple patents benefiting public transit and revenue collection and security systems. He is a frequent speaker and author for transit industry technical conferences on issues of smart card standardization and other emerging electronic media multi-application technologies, including security and related biometrics. He has actively participated in UFTS-APTA transit standards and author of the Regional Interoperability Specification (RIS). He is also serves as a U.S. delegate to the International Standards Committee on ISO/IEC 14443 & 10373 compliance (SC17/WG8). In addition, serves as the Vice-Chair of the US ANSI/INCTS B10/B10.5 delegation for smart cards. He most recently authored the Limited Use contactless smart card proposed ANSI-410 standards specification. He held previous technical and management positions at Texas Instruments, Sony and National Semiconductor. He has received engineering degrees from DeVry Institute of Technology, Chapman University and has completed advanced executive management studies at Stanford University.